DFRWS 2017 Best Paper Award for "Improving the Reliabililty of Chip-off Forensic Analysis of NAND Flash Memory Devices" co-authored by Onur Mutlu

The paper entitled "Improving the Reliabililty of Chip-off Forensic Analysis of NAND Flash Memory Devices" by Aya Fukami (Japan National Police Abgency); Saugata Ghose, Yixin Luo, Yu Cai (Carnegie Mellon University); and Onur Mutlu (ETH Zurich) has been selected as the BEST PAPER at the 4th European Digital Forensics Research Workshop and Conference (DFRWS 2017) held in Überlingen, Lake Constance, Germany.