Onur Mutlu’s invited Flash Memory Errors survey paper published in the Proceedings of the IEEE in September 2017

The paper "Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives" by Yu Cai, Saugata Ghose, Erich F. Haratsch, Yixin Lu and Onur Mutlu has been published in the Proceedings of the IEEE (Volume 105, Issue 9 | September 2017).